Screen LibraryCCD image sensors in deep-ultraviolet：degradation behavior and damage mechanisms
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| Main Authors: | |
|---|---|
| Group Author: | |
| Published: |
Springer,
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| Publisher Address: | Berlin New York |
| Publication Dates: | 2005. |
| Literature type: | Book |
| Language: | English |
| Series: |
Microtechnology and MEMS |
| Subjects: | |
| Carrier Form: | xi, 231 p.: ill. ; 25 cm. |
| ISBN: | 354022680X (hd. bd.) |
| Index Number: | TN911 |
| CLC: |
TN911.73 TP7 TN386.5 |
| Call Number: | TN911.73/L693 |
| Contents: | Includes bibliographical references and index. |