CCD image sensors in deep-ultraviolet:degradation behavior and damage mechanisms
Saved in:
Main Authors: | |
---|---|
Group Author: | |
Published: |
Springer,
|
Publisher Address: | Berlin New York |
Publication Dates: | 2005. |
Literature type: | Book |
Language: | English |
Series: |
Microtechnology and MEMS |
Subjects: | |
Carrier Form: | xi, 231 p.: ill. ; 25 cm. |
ISBN: | 354022680X (hd. bd.) |
Index Number: | TN911 |
CLC: |
TN911.73 TP7 TN386.5 |
Call Number: | TN911.73/L693 |
Contents: | Includes bibliographical references and index. |