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Materials reliability issues in microelectronics：symposium held April 30-May 3, 1991, Anaheim, California, U.S.A.

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Bibliographic Details
Corporate Authors: MRS Symposium on Materials Reliability Issues in Microelectronics 1991 Anaheim, Calif.)
Group Author: Ho P. S; Lloyd J. R; James R. Yost Frederick G
Published: Materials Research Society,
Publisher Address: Pittsburgh, Pa.
Publication Dates: c1991.
Literature type: Book
Language: English
Series: Materials Research Society symposium proceedings ; v. 225
Subjects:
Electrodiffusion > Congresses
Microstructure > Congresses
Microelectronics > Reliability > Congresses
Microelectronics > Materials > Testing > Congresses
Carrier Form: xiii, 358 p.: ill. ; 24 cm.
ISBN: 1558991190
Index Number: TN406
CLC: TN406-532
Contents: Proceedings of the First MRS Symposium on Materials Reliability Issues in Microelectronics.
Includes bibliogrpahical references and index.

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