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Defect-oriented testing for nano-metric CMOS VLSI circuits

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Bibliographic Details
Main Authors: Sachdev Manoj.
Corporate Authors: SpringerLink (Online service)
Group Author: Pineda de Gyvez José.
Published: Springer,
Publisher Address: Dordrecht
Publication Dates: c2007.
Literature type: Book
Language: English
Edition: 2nd ed.
Series: Frontiers in electronic testing ; v. 34
Subjects:
Integrated circuits > Very large scale integration > Testing.
Integrated circuits > Very large scale integration > Defects.
Electronic books.
Metal oxide semiconductors, Complementary > Testing.
Metal oxide semiconductors, Complementary > Defects.
Online Access: http://dx.doi.org/10.1007/0-387-46547-2
Item Description: Defect oriented testing for CMOS analog and digital circuits.
Carrier Form: xxi, 328 p.: ill. ; 24 cm.
ISBN: 9780387465470 (electronic bk.)
0387465472 (electronic bk.)
Index Number: TN43
CLC: TN43
Contents: New edition of: Defect oriented testing for CMOS analog and digital circuits, 1998.
Includes bibliographical references and index.

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