Screen LibraryX-ray characterization of materials
Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor fil...
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| Literature type: | Electronic eBook |
| Language: | English |
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| Online Access: |
http://onlinelibrary.wiley.com/book/10.1002/9783527613748 |
| Summary: |
Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental compos |
| Carrier Form: | xvi, 261 p. : ill. ; 25 cm. |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: |
9783527613748 3527613749 9783527613755 (electronic bk.) 3527613757 (electronic bk.) |
| Index Number: | TA417 |
| CLC: | TB302.1 |
| Contents: |
X-ray diffraction / Application of synchrotron X-radiation to problems in materials science / X-ray fluorescence analysis / Small-angle scattering of x-rays and neutrons / |