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AUTOTESTCON 2005：Orlando, FL, 26-29 September 2005

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Bibliographic Details
Corporate Authors: Autotestcon (2005 Orlando, Fla; Institute of Electrical and Electronics Engineers
Published: IEEE Operations Center,
Publisher Address: Piscataway, N.J.
Publication Dates: c2005.
Literature type: Book
Language: English
Subjects:
Systems engineering
Electronic digital computers > Testing
Weapons systems > Technological innovations
Carrier Form: xxvii, 867 p.: ill. ; 28 cm.
ISBN: 0780391012
Index Number: TP330
CLC: TP330.6-532
TP274-532
N94-532
Call Number: TP274-532/I59/2005
Contents: "IEEE Catalog Number: 05CH37671"
"Our conference theme, Technology Powering the Next Generation of Test, is reflected in our excellent technical program documented in these Proceedings"--Added t.p.
Includes bibliographical references and author index.

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