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Discover the new world of test and design：International Test Conference 1992 proceedings : September 20-24, 1992, Convention Center, Baltimore, MD, USA

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Bibliographic Details
Corporate Authors: International Test Conference (1992 Baltimore, Md; IEEE Computer Society. Test Technology Technical Committee; Institute of Electrical and Electronics Engineers. Philadelphia Section
Published: The Conference,
Publisher Address: Altoona, PA
Publication Dates: c1992.
Literature type: Book
Language: English
Subjects:
Integrated circuits > Testing > Congresses
Automatic checkout equipment > Congresses
Carrier Form: xii, 1012 p.: ill. ; 28 cm.
ISBN: 0780307607 (casebound)
Index Number: TP306
CLC: TP306-532
Call Number: TP306-532/I61/1992/
Contents: Cover title.
"IEEE catalog number 92-CH3191-4"--P. ii.
"IEEE Computer Society Press order number 3167"--P. ii.
Includes bibliographical refrences and index.

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