Reset Filters
Branch: 静安分馆少儿馆

Cover is for reference only

Acoustic scanning probe microscopy /

The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive...

Full description

Saved in:
Bibliographic Details
Corporate Authors: SpringerLink (Online service)
Group Author: Marinello, Francesco; Passeri, Daniele; Savio, Enrico
Published: Springer,
Publisher Address: Berlin ; New York :
Publication Dates: 2013.
Literature type: eBook
Language: English
Series: NanoScience and technology,
Subjects:
Scanning probe microscopy.
Acoustic microscopy.
Physics.
Acoustics.
Engineering.
Nanotechnology.
Surfaces (Physics).
Laser Technology, Photonics.
Nanotechnology and Microengineering.
Characterization and Evaluation of Materials.
Surfaces and Interfaces, Thin Films.
Electronic books.
Online Access: http://dx.doi.org/10.1007/978-3-642-27494-7
Summary: The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including AFAM, UAFM, SNFUH, UFM, SMM and torsional tapping modes. Basic theoretical explanations are given to understand not only the probe dynamics but also the dynamics of tip surface contacts. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave. Different application fields are described, including biological surfaces, polymers and thin films.
Carrier Form: 1 online resource.
Bibliography: Includes bibliographical references and index.
ISBN: 9783642274947 (electronic bk.)
3642274943 (electronic bk.)
Index Number: QH212
CLC: TN742
Contents: Acoustic Scanning Probe Microscopy: An Overview /
Contact, Interactions, and Dynamics /
Cantilever Dynamics: Theoretical Modeling /
One-Dimensional Finite Element Modeling of AFM Cantilevers /
Atomic Force Acoustic Microscopy /
Ultrasonic Atomic Force Microscopy UAFM /
Enhanced Sensitivity of AFAM and UAFM by Concentrated-Mass Cantilevers /
Scanning Microdeformation Microscopy: Advances in Quantitative Micro- and Nanometrology /
Ultrasonic Force Microscopies /
Scanning Near-Field Ultrasound Holography /
Mapping of the Surface's Mechanical Properties Through Analysis of Torsional Cantilever Bending in Dynamic Force Microscopy /
Quantitative Measurements of Elastic Properties with Ultrasonic-Based AFM and Conventional Techniques /
Data Processing for Acoustic Probe Microscopy Techniques /
Friction and Internal Friction Measurements by Atomic Force Acoustic Microscopy /
Quantitative Subsurface Imaging by Acoustic AFM Techniques /
Polymer Material Characterization by Acoustic Force Microscopy /
Application of Acoustic Techniques for Characterization of Biological Samples /

Related Book Recommendations