Advances in imaging and electron physics.. Volume one hundred and seventy six:the Wien filter
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Main Authors: | |
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Group Author: | |
Published: |
Elsevier,
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Publisher Address: | Amsterdam |
Publication Dates: | 2013. |
Literature type: | Book |
Language: | English |
Series: |
Advances in imaging and electron physics ; v. 176 |
Subjects: | |
Carrier Form: | xv, 237 p., [20] p. of plates: col. ill. ; 24 cm. |
ISBN: |
9780124081420 0124081428 |
Index Number: | TN01 |
CLC: |
TN01-1 TN16-1 O46-1 |
Call Number: | O46-1/A244/v.176 |
Contents: |
Includes bibliographical references and index. Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Key features: * Contributions from leading authorities * Informs and updates on all the latest developments in the field. |