International Conference on Defects in Semiconductors 2013 : proceedings of the 27th International Conference on Defects in Semiconductors, ICDS-2013 : Bologna, Italy, 21-26 July 2013 /
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Corporate Authors: | |
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Group Author: | ; |
Published: |
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Literature type: | Book |
Language: | English |
Series: |
AIP conference proceedings,
volume 1583 |
Subjects: | |
Item Description: |
"Conference collection." "All papers have been peer reviewed." |
Carrier Form: | x, 375 pages : illustrations (some color) ; 27 cm. |
Bibliography: | Includes bibliographical references and author index. |
ISBN: | 9781632660459 (paperback) : |
Index Number: | QC611 |
CLC: | O474-532 |
Call Number: | O474-532/I61.1/2013 |