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Optical measurement systems for industrial inspection XIII : 26-29 June 2023, Munich, Germany /

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Bibliographic Details
Corporate Authors: Optical Measurement Systems for Industrial Inspection (Conference) Munich, Germany); SPIE (Society)
Group Author: Lehmann, Peter (Editor)
Published: SPIE,
Publisher Address: Bellingham, Washington :
Publication Dates: [2023]
Literature type: Book
Language: English
Series: Proceedings of SPIE, volume 12618
Subjects:
Quality control > Optical methods$vCongresses.
Optical instruments > Industrial applications > Congresses.
Optical detectors > Industrial applications > Congresses.
Item Description: "At SPIE Optical Metrology"--Cover.
Carrier Form: 1 volume (various pagings) : illustrations, forms ; 27 cm.
Bibliography: Includes bibliographical references.
ISBN: 9781510664456
CLC: TH74-532
Call Number: TH74-532/O62.1/2023

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