New technology challenges metrology /
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Main Authors: | |
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Corporate Authors: | ; ; |
Published: |
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Literature type: | Book |
Language: | English |
Series: |
NBS special publication ;
611 |
Subjects: | |
Item Description: |
"Presented at the Interamerican Metrology Conference, marking the formal establishment of the Interamerican Metrology System, held in Buenos Aires, Argentina, September 4-7, 1979." "Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards." "Issued July 1981." S/N 003-003-02341-8. |
Carrier Form: | 87 p. : ill. ; 28 cm. |
Index Number: | QC100 |
CLC: | TM93-532 |
Call Number: | TM93-532/F873/1979 |