System and Bayesian reliability:essays in honor of Professor Richard E. Barlow on his 70th birthday

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Bibliographic Details
Group Author: Hayakawa Yu.; Irony Telba.; Xie M.; (Min); Barlow Richard E.
Published: World Scientific,
Publisher Address: Singapore River Edge, NJ
Publication Dates: c2001.
Literature type: Book
Language: English
Series: Series on quality, reliability & engineering statistics ; v. 5
Subjects:
Carrier Form: xxvii, 409 p.: ill. ; 23 cm.
ISBN: 9810248652
Index Number: O212
CLC: O212.8
O213.2
TB114.3
Call Number: TB114.3/S995
Contents: Includes bibliographical references and index.