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Soft X-ray microscopy：19-21 July 1992, San Diego, California

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Bibliographic Details
Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Trebes James E; Jacobsen Chris J
Published: SPIE,
Publisher Address: Bellingham, Wash.
Publication Dates: c1993.
Literature type: Book
Language: English
Series: SPIE proceedings series ; v. 1741
Subjects:
Grenz rays > Congresses
X-ray microscopy > Congresses
Carrier Form: xi, 412 p.: ill. ; 28 cm.
ISBN: 0819409146
Index Number: O434
CLC: O434.13-532
Call Number: O434.13-532/S681/1992/
Contents: Includes bibliographical references and index.

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