Defects and diffusion in silicon processing:symposium held April 1-4, 1997, San Francisco, California, U.S.A.

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Bibliographic Details
Group Author: Diaz de la Rubia Tomas
Published: Materials Research Society,
Publisher Address: Pittsburg, Pa.
Publication Dates: c1997.
Literature type: Book
Language: English
Series: Materials Research Society symposium proceedings ; v. 469
Subjects:
Carrier Form: xv, 541 p.: ill. ; 24 cm.
ISBN: 1558993738
Index Number: TN305
CLC: TN305-532
O474-532
TN304.1-532
Call Number: TN304.1-532/D313/1997/
Contents: Includes bibliographical references and index.