Cover is for reference only

Reliability physics 1980：18th annual proceedings, Las Vegas, Nevada, April 8-10, 1980

Saved in:
Bibliographic Details
Corporate Authors: International Reliability Physics Symposium (18th 1980 Las Vegas, Nev; IEEE Electron Devices Society; IEEE Reliability Society
Published: Electron Devices Society and Reliability Society of the Institute of Electrical and Electronics Engineers,
Publisher Address: New York
Publication Dates: c1980.
Literature type: Book
Language: English
Subjects:
Semiconductors > Reliability > Congresses
Semiconductors > Testing > Congresses
Integrated circuits > Reliability > Congresses
Integrated circuits > Testing > Congresses
Carrier Form: vii, 339 p.: ill., ports. ; 28 cm.
Index Number: TN306
CLC: TN306-532
Call Number: TN306-53/I59.1/1980/
Contents: On cover: IEEE 1980 International Reliability Physics.
"IEEE catalog no. 80CH1531-3."
Includes bibliographical references.

Related Book Recommendations