X-ray diffraction : structure, principles, and applications /

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Bibliographic Details
Group Author: Shih, Kaimin
Published: Nova Publishers,
Publisher Address: [Hauppauge], New York :
Publication Dates: [2013]
Literature type: Book
Language: English
Series: Materials science and technologies
Subjects:
Carrier Form: ix, 282 pages : illustrations ; 26 cm.
Bibliography: Includes bibliographical references and index.
ISBN: 9781628085914 (hardback) :
1628085916 (hardback)
Index Number: TA417
CLC: O766
O722
Call Number: O722/X1