Screen LibraryScanning probe microscopy of functional materials：nanoscale imaging and spectroscopy
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| Corporate Authors: | |
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| Group Author: | ; ; |
| Published: |
Springer,
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| Publisher Address: | New York |
| Publication Dates: | c2011. |
| Literature type: | Book |
| Language: | English |
| Subjects: | |
| Online Access: |
http://dx.doi.org/10.1007/978-1-4419-7167-8 |
| Carrier Form: | 1 online resource (xviii, 555 p.): ill. |
| ISBN: |
9781441971678 (electronic bk.) 144197167X (electronic bk.) |
| Index Number: | TH742 |
| CLC: | TH742 |
| Contents: |
Includes bibliographical references and index. The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to struc. |