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ITC：International Test Conference 2001 : proceedings : October 30-November 1, 2001, Baltimore, MD, USA

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Bibliographic Details
Corporate Authors: International Test Conference (32nd 2001 Baltimore, Md; Institute of Electrical and Electronics Engineers. Philadelphia Section; IEEE Computer Society. Test Technology Technical Committee
Published: International Test Conference IEEE,
Publisher Address: Washington, D.C. Piscataway, N.J.
Publication Dates: c2001.
Literature type: Book
Language: English
Subjects:
Electronic digital computers > Circuits > Testing
Telecommunication
Radio frequency
Integrated circuits > Testing
Carrier Form: xiv, 1201 p.: ill. ; 28 cm.
Publication Frequency: Also available via the World Wide Web with additional title: Test Conference, 2001, proceedings, International.
ISBN: 0780371690
0780371704 (micofiche edition)
Index Number: TP306
CLC: TP306-532
Call Number: TP306-532/I61/2001
Contents: Conference number inferred.
Cover title.
"IEEE Catalog Number 01CH37260"--T.p. verso.
Includes bibliographical references and author index.

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