Machine vision systems for inspection and metrology VIII:21-22 September 1999, Boston, Massachusetts
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Corporate Authors: | |
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Group Author: | ; ; |
Published: |
SPIE,
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Publisher Address: | Bellingham, Wash. |
Publication Dates: | c1999. |
Literature type: | Book |
Language: | English |
Series: |
Proceedings of SPIE ; v. 3836 |
Subjects: | |
Carrier Form: | vii, 252 p.: ill. ; 28 cm. |
ISBN: | 0819434299 |
Index Number: | TP274 |
CLC: |
TP274-532 TP391.4-532 |
Call Number: | TP391.4-532/M149/1999/ |
Contents: | Includes bibliographic references and author index. |