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Machine vision systems for inspection and metrology VIII：21-22 September 1999, Boston, Massachusetts

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Bibliographic Details
Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Solomon Susan Snell; Batchelor Bruce G; Miller John W. V
Published: SPIE,
Publisher Address: Bellingham, Wash.
Publication Dates: c1999.
Literature type: Book
Language: English
Series: Proceedings of SPIE ; v. 3836
Subjects:
Engineering inspection > Automation
Optical measurements
Computer vision > Industrial applications
Computer vision
Carrier Form: vii, 252 p.: ill. ; 28 cm.
ISBN: 0819434299
Index Number: TP274
CLC: TP274-532
TP391.4-532
Call Number: TP391.4-532/M149/1999/
Contents: Includes bibliographic references and author index.

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