Screen LibraryTest generation of crosstalk delay faults in VLSI circuits /
This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on cu...
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| Main Authors: | |
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| Group Author: | |
| Published: |
Springer,
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| Publisher Address: | Singapore : |
| Publication Dates: | [2019] |
| Literature type: | Book |
| Language: | English |
| Subjects: | |
| Summary: |
This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing. |
| Carrier Form: | xi, 156 pages : illustrations (some color) ; 24 cm |
| Bibliography: | Includes bibliographical references. |
| ISBN: |
9789811324925 9811324921 9789811324949 9811324948 |
| Index Number: | TK7874 |
| CLC: | TN47 |
| Call Number: | TN47/J425 |
| Contents: | Chapter 1. Background and Review of Crosstalk Delay Fault Models and the Crosstalk Effects -- Chapter 2. Review of Test Generation Techniques for Crosstalk Delay Faults -- Chapter 3. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults Using Modified PODEM and FAN Algorithm -- Chapter 4. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults using Single-Objective Genetic Algorithm -- Chapter 5. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults Using Single-Objective Particle Swarm Optimization -- Chapter 6. Simulation of Asynchronous Sequential Circuits using Fuzzy Delay Model -- Chapter 7. Simulation Based Test Generation for Crosstalk Delay Faults in Asynchronous Sequential Circuits. |