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International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics：11-13 May, 1995, Kiev, Ukraine

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Bibliographic Details
Corporate Authors: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics (1995 Kiev, Ukraine); Society of Photo-Optical Instrumentation Engineers; SPIE Ukraine Chapter.; International Association of the Academies of Sciences.
Group Author: (Mikhail I︠A︡kovlevich); Svechnikov Sergeĭ Vasilʹevich.; Valakh M. I︠A︡.
Published: SPIE,
Publisher Address: Bellingham, Wash.
Publication Dates: c1995.
Literature type: Book
Language: English
Series: SPIE proceedings series ; v. 2648
Subjects:
Optoelectronics > Congresses. > Congresses. > Congresses.
Microelectronics > Congresses. > Congresses. > Congresses.
Quantum electronics > Congresses. > Congresses. > Congresses.
Electronics > Congresses. > Congresses. > Congresses.
Carrier Form: xv, 768 p.: ill. ; 28 cm.
ISBN: 0819420212
Index Number: TN20
CLC: TN20-532
TN40-532
Call Number: TN20-532/I61/1995/
Contents: Includes bibliographic references and author index.

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