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2010 IEEE International Integrated Reliability Workshop final report：(IRW 2010), S. Lake Tahoe, California, 17-21 October 2010.

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Bibliographic Details
Corporate Authors: International Integrated Reliability Workshop (2010 S. Lake Tahoe, California; Institute of Electrical and Electronic Engineers
Published: IEEE
Publisher Address: Piscataway, N.J.
Publication Dates: c 2010.
Literature type: Book
Language: English
Subjects:
Integrated circuits > Reliability
Integrated circuits > Wafer-scale integration > Reliability
Carrier Form: ix, 180 p.: ill. ; 28 cm.
ISBN: 9781424485215 (pbk.)
Index Number: TN06
CLC: TN06-532
TN406-532
Call Number: TN406-532/I61/2010
Contents: IEEE catalog number: CFP10IRW-PRT.
Includes bibliographical references.

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