Screen LibraryTrace analysis by mass spectrometry /
Saved in:
| Corporate Authors: | |
|---|---|
| Group Author: | |
| Published: |
Academic Press,
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| Publisher Address: | New York : |
| Publication Dates: | 1972. |
| Literature type: | eBook |
| Language: | English |
| Subjects: | |
| Online Access: |
http://www.sciencedirect.com/science/book/9780120446506 |
| Item Description: | Chapter 12. The Analysis of Gases in Solids. |
| Carrier Form: | 1 online resource (xiii, 460 pages) : illustrations |
| Bibliography: | Includes bibliographical references. |
| ISBN: |
9780323140737 0323140734 1299442358 9781299442351 0120446502 9780120446506 |
| Index Number: | QD139 |
| CLC: | O657.6 |
| Contents: |
Front Cover; Trace Analysis by Mass Spectrometry; Copyright Page; Table of Contents; 8.4 Standard Samples; List of Contributors; Preface; Chapter 1. Introductory Review; 1.1 Proem; 1.2 Re sume ; 1.3 Problems and Proposals; References; Chapter 2. Physics and Techniques of Electrical Discharge Ion Sources; 2.1 The Task of the Ion Source: From Solids to Ion Beams; 2.2 Physics of Electrical Discharges in Vacuum; 2.3 Techniques of Ion Formation Using Electrical Discharges; References; Chapter 3. The Transmission of Ions through Double Focusing Mass Spectrometers. 3.1 Focusing and Dispersing Properties of Deflection Fields3.2 Field Combinations to Achieve Velocity Focusing in Addition to Angular Focusing; 3.3 Deviations of the Properties of Real Fields from the Results of the Simplified First-Order Theory; 3.4 Focusing in the z-Direction; 3.5 Performance Characteristics; 3.6 Existing Instruments; References; Chapter 4. Detection and Measurement of Ions by Ion-Sensitive Plates; 4.1 Introduction; 4.2 General Considerations; 4.3 Physical Characteristics; 4.4 The Blackening Process; 4.5 Plate Response and Evaluation. 4.6 Plate Replacement Schemes and Special Methods4.7 Plate Processing; 4.8 Conclusions; References; Chapter 5. Electrical Measurements of Mass Resolved Ion Beams; 5.1 Introduction; 5.2 Historical Development; 5.3 Signal Characteristics; 5.4 Signal Referencing; 5.5 Scanning; 5.6 Peak Switching; 5.7 Errors; 5.8 Detection Limits; 5.9 Analysis Time; 5.10 Other Applications and Techniques; 5.11 Summary; References; Chapter 6. Interpretation of Mass Spectrograph Plates; 6.1 Introduction; 6.2 The Spark-Source Mass Spectrograph Plate; 6.3 Qualitative Analysis. 6.4 Quantitative Analysis-Theoretical Considerations6.5 Quantitative Analysis-Practical Considerations; 6.6 Treatment of Results; 6.7 Summary; References; Chapter 7. Computer Techniques for Solids Analysis; 7.1 Introduction; 7.2 What Can/Should Computers Do for the Mass Spectrometrist?; 7.3 Batch Systems; 7.4 Using Time-Sharing; 7.5 Dedicated or ''Stand Alone"" Systems-Minicomputers; 7.6 Languages; References; Chapter 8. Relating the Mass Spectrum to the Solid Sample Composition; 8.1 Introduction; 8.2 Elemental Discrimination and Its Control; 8.3 Relative Sensitivity Factors. 8.5 Isotope DilutionReferences; Chapter 9. Insulators, Powders, and Microsamples; 9.1 Introduction; 9.2 Experimental Techniques; 9.3 Analysis of Microsamples; References; Chapter 10. The Analysis of Low-Melting and Reactive Samples; 10.1 Introduction; 10.2 Sodium Sampling and Handling Techniques; 10.3 Analysis of Sample; 10.4 Results and Discussion; 10.5 On-Stream Analysis by SSMS; References; Chapter 11. The Analysis of Radioactive Samples by Spark-Source Mass Spectrometry; 11.1 Introduction; 11.2 Protection; 11.3 Uranium and Transuranium Samples; 11.4 Other Radioactive Samples; References. |