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CLC: O - 数理科学和化学

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Optics Damage and Materials Processing by EUV/X-ray Radiation (XDam8) : 24-26 April 2023, Prague, Czech Republic /

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Bibliographic Details
Corporate Authors: Optics Damage and Materials Processing by EUV/X-Ray Radiation (Congresses) Prague, Czech Republic); ELI Beamlines (Czech Republic) (co-organizing body.); HiLASE (Czech Republic) (co-organizing body.); Laserlab Europe (co-organizing body.); AWE (United Kingdom) (co-organizing body.); STFC (United Kingdom) (co-organizing body.); Society of Photographic Instrumentation Engineers. (sponsoring body.)
Group Author: Juha, Libor (Editor); Bajt, Saša (Editor); Guizard, Stéphane (Editor)
Published: SPIE,
Publisher Address: Bellingham, Washington :
Publication Dates: [2023]
Literature type: Book
Language: English
Series: Proceedings of SPIE, volume 12578
Subjects:
Optical materials > Deterioration > Congresses.
Item Description: "At SPIE Optics + Optoelectronics" -- Cover.
Carrier Form: 1 volume (various pagings) : illustrations ; 27 cm.
Bibliography: Includes bibliographical references.
ISBN: 9781510662766
1510662774
9781510662773
CLC: O434-532
Call Number: O434-532/O627/2023

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