IEEE Instrumentation and Measurement Conference
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Corporate Authors: | |
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Published: |
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Publisher Address: | New York, NY |
Literature type: | Book |
Language: | English |
Subjects: | |
Carrier Form: | xiii, 295 p.: |
Index Number: | TM93 |
CLC: | TM93-53 |
Contents: |
Cover title: Standards of excellence. Includes bibliographies and index. |