Screen LibraryIEEE Instrumentation and Measurement Conference
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| Corporate Authors: | |
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| Published: |
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| Publisher Address: | New York, NY |
| Literature type: | Book |
| Language: | English |
| Subjects: | |
| Carrier Form: | xiii, 295 p.: |
| Index Number: | TM93 |
| CLC: | TM93-53 |
| Contents: |
Cover title: Standards of excellence. Includes bibliographies and index. |