Screen LibraryX-ray optics and microanalysis：proceedings of the 20th international congress, Karlsruhe, Germany, 15-18 September 2009
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| Corporate Authors: | |
|---|---|
| Group Author: | ; |
| Published: |
American Institute of Physics,
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| Publisher Address: | Melville, N.Y. |
| Publication Dates: | 2010. |
| Literature type: | Book |
| Language: | English |
| Series: |
AIP conference proceedings ; 1221 |
| Subjects: | |
| Carrier Form: | xiv, 214 p.: ill. ; 28 cm. |
| ISBN: |
9780735407640 (hc.) 0735407649 |
| Index Number: | O434 |
| CLC: |
O434.1-532 TB303-532 |
| Call Number: | O434.1-532/X8/2009 |
| Contents: |
"All papers have been peer reviewed." "This book contains peer-reviewed proceeding contributions to the 20th International Congress on X-ray Optics and Microanalysis, ICXOM20, held in Karlsruhe, Germany, from the 15th to the 18th of September 2009"--P. ix. Includes bibliographical references and index. Advances in instrumentation, detection, and methodology -- X-ray optics monochromators and multilayers, focusing optics -- Quantitative and multivariate analysis -- Imaging techniques and image processing -- Applications of nano-, micro-, and surface analysis techniques. |