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Microelectronics failure analysis : desk reference /

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Bibliographic Details
Corporate Authors: ASM International; Electronic Device Failure Analysis Society
Group Author: Gandhi, Tejinder
Published: ASM International,
Publisher Address: Materials Park, Ohio :
Publication Dates: [2019]
Literature type: Book
Language: English
Edition: Seventh edition.
Subjects:
Electronics > Materials > Testing > Handbooks, manuals, etc.
Microelectronics > Materials > Testing > Handbooks, manuals, etc.
Microelectronics > Materials > Defects > Handbooks, manuals, etc.
Electronic apparatus and appliances > Testing > Handbooks, manuals, etc.
Semiconductors > Defects > Handbooks, manuals, etc.
Electronic apparatus and appliances > Testing.
Electronics > Testing. > Testing.
Microelectronics > Defects. > Defects.
Microelectronics > Testing. > Testing.
Semiconductors > Defects.
Handbooks and manuals.
Item Description: "An ASM materials solutions publication."
"EDFAS, Electronic Device Failure Analysis Society, ASM International."
Carrier Form: xi, 705 pages : illustrations (some color) ; 28 cm
Bibliography: Includes bibliographical references and indexes.
ISBN: 9781627082457
162708245X
Index Number: TK7871
CLC: TN407-62
Call Number: TN407-62/M626/7th ed.

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