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Fifteenth International Conference on Quality Control by Artificial Vision : 12-14 May 2021, virutal Tokushima, Japan /

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Bibliographic Details
Corporate Authors: International Conference on Quality Control by Artificial Vision Online); SPIE (Society)
Group Author: Terada, Kenji; Nakamura, Akio; Komuro, Takashi; Shimizu, Tsuyoshi
Published: SPIE,
Publisher Address: Bellingham, Washington :
Publication Dates: [2021]
Literature type: Book
Language: English
Series: Proceedings of SPIE, volume 11794
Subjects:
Quality control > Optical methods > Congresses.
Computer vision > Industrial applications > Congresses.
Imaging systems > Quality control > Congresses.
Pattern recognition systems > Quality control > Congresses.
Optical detectors > Congresses.
Carrier Form: 1 volume (various pagings) : illustrations, forms ; 27 cm.
Bibliography: Includes bibliographical references.
ISBN: 9781510644267
CLC: TP391.41-532
Call Number: TP391.41-532/I613/2021

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