Screen LibraryElectron and ion microscopy and microanalysis：principles and applications
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| Main Authors: | |
|---|---|
| Published: |
M. Dekker,
|
| Publisher Address: | New York |
| Publication Dates: | c1991. |
| Literature type: | Book |
| Language: | English |
| Edition: | 2nd ed., rev. and expanded. |
| Series: |
Optical engineering ; 29 |
| Subjects: | |
| Carrier Form: | xiv, 837 p.: ill. ; 27 cm. |
| ISBN: | 0824785568 (acid-free paper) |
| Index Number: | TN153 |
| CLC: | TN153 |
| Call Number: | TN153/M979/2nd ed./ |
| Contents: | Includes bibliographical references and indexes. |