Screen LibraryAn essential guide to electronic material surfaces and interfaces /
"An Essential Guide to Electronic Material Surfaces and Interfaces is a streamlined yet comprehensive introduction that covers the basic physical properties of electronic materials, the experimental techniques used to measure them, and the theoretical methods used to understand, predict, and de...
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| Main Authors: | |
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| Corporate Authors: | |
| Published: |
John Wiley & Sons, Inc.,
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| Publisher Address: | Hoboken, New Jersey : |
| Publication Dates: |
[2016] ©2016 |
| Literature type: | eBook |
| Language: | English |
| Subjects: | |
| Online Access: |
http://onlinelibrary.wiley.com/book/10.1002/9781119027140 |
| Summary: |
"An Essential Guide to Electronic Material Surfaces and Interfaces is a streamlined yet comprehensive introduction that covers the basic physical properties of electronic materials, the experimental techniques used to measure them, and the theoretical methods used to understand, predict, and design them. Starting with the fundamental electronic properties of semiconductors and electrical measurements of semiconductor interfaces, this text introduces students to the importance of characterizing and controlling macroscopic electrical properties by atomic-scale techniques. The chapters that fol |
| Carrier Form: | 1 online resource |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: |
9781119027133 (pdf) 1119027136 (pdf) 9781119027126 (electronic bk.) 1119027128 (electronic bk.) 9781119027140 1119027144 111902711X 9781119027119 |
| Index Number: | TK7871 |
| CLC: | TN04 |
| Contents: | Why surfaces and interfaces of electronic materials -- Semiconductor electronic and optical properties -- Electrical measurements of surfaces and interfaces -- Localized states at surfaces and interfaces -- Ultrahigh vacuum technology -- Surface and interface analysis -- Surface and interface spectroscopies -- Dynamical depth-dependent analysis and imaging -- Electron beam diffraction and microscopy of atomic-scale geometrical structure -- Scanning probe techniques -- Optical spectroscopies -- Electronic material surfaces -- Surface electronic applications -- Semiconductor heterojunctions -- |