9th International Symposium on Advanced Optical Manufacturing and Testing Technologies : optical test, measurement technology, and equipment : 26-29 June 2018, Chengdu, China /

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Bibliographic Details
Corporate Authors: International Symposium on Advanced Optical Manufacturing and Testing Technologies Chengdu, China; SPIE Society
Group Author: Wu, Fan; Zhang, Yudong; Ma, Xiaoliang; Li, Xiong; Fan, Bin
Published: SPIE,
Publisher Address: Bellingham, Washington :
Publication Dates: [2019]
Literature type: Book
Language: English
Series: Proceedings of SPIE, volume 10839
Subjects:
Carrier Form: 1 volume (various pagings) : illustrations, forms ; 28 cm.
Bibliography: Includes bibliographical references.
ISBN: 9781510623200 (paperback) :
1510623205 (paperback)
CLC: TH743-532
Call Number: TH743-532/I617/2018/[v.5]