Screen LibraryAdvanced optical techniques for quantum information, sensing, and metrology : 4-5 February 2020, San Francisco, California, USA /
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| Corporate Authors: | ; |
|---|---|
| Group Author: | ; ; |
| Published: |
SPIE,
|
| Publisher Address: | Bellingham, Washington : |
| Publication Dates: | [2020] |
| Literature type: | Book |
| Language: | English |
| Series: |
Proceedings of SPIE,
volume 11295 |
| Subjects: | |
| Item Description: | "SPIE OPTO""--Cover. |
| Carrier Form: | 1 volume (various pagings) : illustrations ; 28 cm. |
| Bibliography: | Includes bibliographical references. |
| ISBN: |
9781510633537 1510633537 |
| CLC: | TN929.1-532 |
| Call Number: | TN929.1-532/A244/2020 |