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1

Cover is for reference only

Infrared imaging systems：design, analysis, modeling, and testing XX : 14-16 April 2009, Orlando, Florida, United States

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Holst Gerald C
Published: SPIE,
Publication Dates: c2009.
Call Number: TN21-532/I43.2/2009

Book

2

Cover is for reference only

Infrared imaging systems：design, analysis, modeling, and testing XIX : 18-19 March 2008, Orlando Florida, USA

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Holst Gerald C
Published: SPIE,
Publication Dates: c2008.
Call Number: TN21-532/I43.2/2008

Book

3

Cover is for reference only

Infrared imaging systems：design, analysis, modeling, and testing XXI : 6-8 April 2010, Orlando, Florida, United States

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Holst Gerald C; Krapels Keith A.
Published: SPIE,
Publication Dates: c2010.
Call Number: TN21-532/I43.2/2010

Book

4

Cover is for reference only

Infrared imaging systems：design, analysis, modeling, and testing XII : 18-19 April 2001, Orlando, USA

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Holst Gerald C
Published: SPIE,
Publication Dates: c2001.
Call Number: TN21-532/I43.2/2001

Book

5

Cover is for reference only

Infrared imaging systems：design, analysis, modeling, and testing IX : 15-16 April 1998, Orlando, Florida

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Holst Gerald C
Published: SPIE,
Publication Dates: c1998.
Call Number: TN21-532/I43.2/1998/

Book

6

Cover is for reference only

Infrared imaging systems：design, analysis, modeling, and testing VIII : 23-24 April 1997, Orlando, Florida

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Holst Gerald C
Published: SPIE,
Publication Dates: c1997.
Call Number: TN21-532/I43.2/1997/

Book

7

Cover is for reference only

Infrared imaging systems：design, analysis, modeling, and testing XVIII : 11-13 April 2007, Orlando Florida, USA

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Holst Gerald C
Published: SPIE,
Publication Dates: c2007.
Call Number: TN21-532/I43.2/2007

Book

8

Cover is for reference only

Infrared imaging systems：design, analysis, modeling, and testing XVII : 19-20 April, 2006, Kissimmee, Florida, USA

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Holst Gerald C
Published: SPIE,
Publication Dates: c2006.
Call Number: TN21-532/I43.2/2006

Book

9

Cover is for reference only

Infrared imaging systems：design, analysis, modeling, and testing XV : 14-15 April, 2004, Orlando, Florida, USA

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Holst Gerald C
Published: SPIE,
Publication Dates: c2004.
Call Number: TN21-532/I43.2/2004

Book

10

Cover is for reference only

Infrared imaging systems：design, analysis, modeling, and testing XIV : 23-24 April, 2003, Orlando, Florida, USA

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Holst Gerald C
Published: SPIE,
Publication Dates: c2003.
Call Number: TN21-532/I43.2/2003

Book

11

Cover is for reference only

Infrared imaging systems：design, analysis, modeling, and testing XI : 26-27 April, 2000, Orlando, [Florida] USA

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Holst Gerald C
Published: SPIE,
Publication Dates: c2000.
Call Number: TN21-532/I43.2/2000

Book

12

Cover is for reference only

Infrared imaging systems：design, analysis, modeling, and testing X : 7-8 April, 1999, Orlando, Florida

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Holst Gerald C
Published: SPIE,
Publication Dates: c1999.
Call Number: TN21-532/I43.2/1999/

Book

13

Cover is for reference only

Infrared imaging systems：design, analysis, modeling, and testing VII : 10-11 April 1996, Orlando, Florida

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Holst Gerald C
Published: SPIE,
Publication Dates: c1996.
Call Number: TN21-532/I43.2/1996/

Book

14

Cover is for reference only

Infrared imaging systems：design, analysis, modeling, and testing VI : 19-20 April 1995, Orlando, Florida

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Holst Gerald C
Published: SPIE,
Publication Dates: c1995.
Call Number: TN21-532/I43.2/1995

Book

15

Cover is for reference only

Infrared imaging systems：design, analysis, modeling, and testing V : 7-8 April 1994, Orlando, Florida

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Holst Gerald C
Published: SPIE,
Publication Dates: c1994.
Call Number: TN21-532/I43.2/1994/

Book

16

Cover is for reference only

Infrared imaging systems：design, analysis, modeling, and testing IV : 14-15 April 1993, Orlando, Florida

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Holst Gerald C
Published: SPIE,
Publication Dates: c1993.
Call Number: TN21-532/I43.2/1993/

Book

17

Cover is for reference only

Infrared imaging systems：design, analysis, modeling, and testing III : 23-24 April 1992, Orlando, Florida

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Holst Gerald C
Published: SPIE,
Publication Dates: c1992.
Call Number: TN21-532/I43.2/1992/

Book

18

Cover is for reference only

Infrared imaging systems：design, analysis, modeling, and testing II, 3-5 April 1991, Orlando, Florida

Group Author: Holst Gerald C
Published: The Society,
Publication Dates: c1991.

Book

19

Cover is for reference only

Infrared and passive millimeter-wave imaging systems：design, analysis, modeling, and testing : 3-5 April 2002, Orlando, USA

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Appleby Roger; Holst Gerald C; Wikner David A
Published: SPIE,
Publication Dates: c2002.
Call Number: TN21-532/I439-8/2002

Book

20

Cover is for reference only

Infrared imaging systems：design, analysis, modeling, and testing : 16-18 April 1990, Orlando, Florida

Corporate Authors: CREOL Research center; SPIE Technical Symposium on Optical Engineering Photonics in Aerospace Sensing (1990 Orlando, Fla.); Society of Photo-Optical Instrumentation Engineers
Group Author: Holst Gerald C
Published: The Society,
Publication Dates: c1990.
Call Number: TN21-53/I43.16/1990/

Book

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