馆藏书目查询系统 - 上海图书馆

1

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Monte Carlo modeling for electron microscopy and microanalysis

Main Authors: Joy David C 1943-
Published: Oxford University Press,
Publication Dates: 1995.
Call Number: TN16-39/J88/

Book

2

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EXAFS spectroscopy, techniques and applications

Corporate Authors: Materials Research Society
Group Author: Teo B. K; Joy David C 1943-
Published: Plenum Press,
Publication Dates: c1981.
Call Number: O434.13-53/E96/

Book

3

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Introduction to electron holography

Main Authors: Völkl Edgar
Group Author: Allard Lawrence F; Joy David C 1943-
Published: Kluwer Academic/Plenum Publishers,
Publication Dates: c1999.
Call Number: TB877/V918

Book

4

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Microscopy of semiconducting materials, 1981：proceedings of the Royal Microscopical Society Conference held in St. Catherine's College, Oxford, 6-10 April 1981

Corporate Authors: Oxford Conference on Microscopy of Semiconducting Materials 1981 Oxford).; Royal Microscopical Society Great Britain. Materials Section; Institute of Physics. Electron Microscopy and Analysis Group
Group Author: Cullis A. G; Joy David C 1943-
Published: The Institute of Physics,
Publication Dates: c1981.
Call Number: O47-53/O98/1981/

Book

5

Cover is for reference only

Introduction to analytical electron microscopy

Corporate Authors: Electron Microscopy Society of America; Microbeam Analysis Society
Group Author: Hren John J; Goldstein Joseph 1939-; Joy David C 1943-
Published: Plenum Press,
Publication Dates: c1979.
Call Number: TN153/H873/

Book

6

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Principles of analytical electron microscopy

Group Author: Joy David C; Romig Alton D; Goldstein Joseph I
Published: Plenum Press,
Publication Dates: c1986.
Call Number: TN153/P957/

Book

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