Scientific detection of fakery in art：29-30 January 1998, San Jose, California

Corporate Authors: IS & T--the Society for Imaging Science and Technology.; Society of Photo-Optical Instrumentation Engineers
Group Author: Chartier Duane R.; Weiss Richard J.; (Richard Jerome), 1923-; McCrone Walter.
Published: SPIE,
Publication Dates: c1998.
Call Number: K854.2-532/S416/1998/