International Test Conference 2003：proceedings : board and system test track : [September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA

Corporate Authors: International Test Conference (2003 Charlotte, N.C; IEEE Computer Society. Test Technology Technical Committee; Institute of Electrical and Electronics Engineers. Philadelphia Section
Published: International Test Conference IEEE,
Publication Dates: c2003.
Call Number: TP306-532/I61/2003