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Advances in metrology for X-ray and EUV optics VIII : 11-12 August 2019, San Diego, California, United States /

Cover is for reference only
Corporate Authors: SPIE Society
Group Author: Assoufid, Lahsen; Ohashi, Haruhiko; Asundi, Anand
Published: SPIE,
Publication Dates: [2019]
Call Number: TB96-532/A244-1/2019
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Advances in metrology for X-ray and EUV optics VII : 6-7 August 2017, San Diego, California, United States /

Cover is for reference only
Corporate Authors: SPIE Society
Group Author: Assoufid, Lahsen; Ohashi, Haruhiko; Asundi, Anand
Published: SPIE,
Publication Dates: [2017]
Call Number: TB96-532/A244-1/2017
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Advances in metrology for X-ray and EUV optics V : 18 August 2014, San Diego, California, United States /

Cover is for reference only
Corporate Authors: SPIE Society
Group Author: Assoufid, Lahsen; Ohashi, Haruhiko; Asundi, Anand
Published: SPIE,
Publication Dates: [2014]
Call Number: TB96-532/A244-1/2014
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