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2007 IEEE International Test Conference：Santa Clara, CA, 21-26 October 2007.

Corporate Authors: International Test Conference (2007 Santa Clara, CA; IEEE Xplore Online service; Institute of Electrical and Electronics Engineers
Published: Institute of Electrical and Electronics Engineers,
Publication Dates: c2007.
Call Number: TN407-532/I594/2007

Book

2

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Proceedings of 2008 IEEE International Symposium on Circuits and Systems：Seattle, WA, 18-21 May 2008.

Corporate Authors: IEEE International Symposium on Circuits and Systems (2008 Seattle, WA); Institute of Electrical and Electronics Engineers
Published: IEEE,
Publication Dates: c2008.
Call Number: TM13-532/I61.1/2008

Book

3

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ISCAS 2006：2006 IEEE International Symposium on Circuits and Systems : Circuits and systems: at crossroads of life and technology : proceedings : 21-24 May 2006 : Kos International Convention Centre (KICC), Island of Kos, Greece

Corporate Authors: IEEE International Symposium on Circuits and Systems (2006 Island of Kos, Greece); Institute of Electrical and Electronics Engineers; IEEE Circuits and Systems Society
Published: IEEE,
Publication Dates: 2006.
Call Number: TM13-532/I61.1/2006/v.1

Book

4

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ISCAS 2000 Geneva：proceedings [of] the 2000 IEEE International Symposium on Circuits and Systems, Emerging technologies for the 21st century : May 28-31, 2000, International Conference Center (CICG) of Geneva, Switzerland

Corporate Authors: (2000; IEEE Circuits and Syatems Society.
Published: IEEE,
Publication Dates: c2000.
Call Number: TM13-532/I61.1/2000

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