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Author Results for Shea Herbert R.

(美)Allyson L. Hartzell，(美)Mark G. da Silva，(瑞士)Herbert R. Shea著
Da Silva,Mark G.
Hartzell,Allyson L.
SPIE Society
Senturia,Stephen D.,
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Shea,Herbert R.
SpringerLink (Online service)

1
Reliability, packaging, testing, and characterization of moems/mems and nanodevices XII 4-5 February 2013, San Francisco, California, United States

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Corporate Authors: SPIE Society
Group Author: Ramesham Rajeshuni (editor of compilation.); Shea Herbert R (editor of compilation.)
Published: SPIE,
Publication Dates: [2013]
Call Number: TN406-532/R382/2013
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2
MEMS可靠性

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Main Authors: 美 哈策尔 Hartzell, Allyson L. ((美)Allyson L. Hartzell，(美)Mark G. da Silva，(瑞士)Herbert R. Shea著); 美 席尔瓦 Silva, Mark G.; 瑞士 谢伊 Shea, Herbert R.
Group Author: 恩云飞 (译); 贾玉斌 (译); 黄钦文 (译)
Published: 电子工业出版社
Publication Dates: 2012
Call Number: TN4/6082
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3
MEMS reliability

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Main Authors: Hartzell Allyson L.
Corporate Authors: SpringerLink (Online service)
Group Author: Shea Herbert R.; Senturia Stephen D., 1940-; Da Silva Mark G.
Published: Springer,
Publication Dates: 2011.
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