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1

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Metrology, inspection, and process control for microlithography XIX：28 February-3 March, 2005, San Jose, California, USA

Corporate Authors: International SEMATECH; Society of Photo-Optical Instrumentation Engineers
Group Author: Silver Richard M
Published: SPIE,
Publication Dates: c2005.
Call Number: TN405.7-532/M594/2005

Book

2

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Metrology, inspection, and process control for microlithography XVIII：23-26 February, 2004, Santa Clara, California, USA

Corporate Authors: Semiconductor Equipment and Materials International; International SEMATECH; Society of Photo-Optical Instrumentation Engineers
Group Author: Silver Richard M
Published: SPIE,
Publication Dates: c2004.
Call Number: TN405.7-532/M594/2004

Book

3

Cover is for reference only

Maximum entropy and Bayesian methods：proceedings of the fifteenth International Workshop on Maximum Entropy and Bayesian Methods, Santa Fe, New Mexico, USA, 1995

Corporate Authors: International Workshop on Maximum Entropy and Bayesian Methods (15th 1995 Santa Fe, N.M
Group Author: Hanson Kenneth M; Silver Richard N
Published: Kluwer Academic Publishers,
Publication Dates: c1996.
Call Number: O212.8-532/I61/1995/

Book

4

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Case studies in systemic sclerosis

Corporate Authors: SpringerLink (Online service)
Group Author: Silver Richard M.; Denton C. P.; (Christopher P.)
Published: Springer,
Publication Dates: c2011.

Book

5

Cover is for reference only

Modeling aspects in optical metrology VI : 26-28 June 2017, Munich, Germany /

Corporate Authors: Modeling Aspects in Optical Metrology Conference Munich, Germany; SPIE Society
Group Author: Bodermann, Bernd; Frenner, Karsten; Silver, Richard M
Published: SPIE,
Publication Dates: [2017]
Call Number: O432.2-532/M689/2017

Book

6

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Modeling aspects in optical metrology V : 23-25 June 2015, Munich, Germany /

Corporate Authors: SPIE Society; European Optical Society; German Scientific Laser Society Wissenschaftliche Gesellschaft Lasertechnik e.V
Group Author: Frenner, Karsten; Bodermann, Bernd; Silver, Richard M
Published: SPIE,
Publication Dates: [2015]
Call Number: O432.2-532/M689/2015

Book

7

Cover is for reference only

Modeling aspects in optical metrology IV : 13-14 May 2013, Munich, Germany /

Corporate Authors: SPIE Society; Modeling aspects in optical metrology Munich, Germany
Group Author: Bodermann, Bernd; Frenner, Karsten; Silver, Richard M
Published: SPIE,
Publication Dates: [2013]
Call Number: O432.2-532/M689/2013

Book

8

Cover is for reference only

Modeling aspects in optical metrology II：15-16 June 2009, Munich, Germany

Corporate Authors: European Optical Society; Wissenschaftliche Gesellschaft Lasertechnik; SPIE Society; SPIE Europe
Group Author: Bodermann Bernd; Silver Richard M; Bosse Harald
Published: SPIE,
Publication Dates: 2009.
Call Number: O432.2-532/M689/2009

Book

9

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Modeling aspects in optical metrology：18-19 June 2007, Munich, Germany

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Bodermann Bernd; Silver Richard M; Bosse Harald
Published: SPIE,
Publication Dates: c2007.
Call Number: O432.2-532/M689/2007

Book

10

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多元智能与学习风格 = So each may learn：integrating learning styles and multiple intelligencess

Main Authors: 美席尔瓦 H. F ((美) 哈维·席尔瓦等著); 美 Silver Harvey F.; 美斯特朗 R. W.; 美 Strong Richard W.; 美佩里尼 M. J.; 美 Perini Matthew J.
Group Author: 张玲 (译)
Published: 教育科学出版社
Publication Dates: 2003
Call Number: G632.421/0221

Book

11

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The Oxford handbook of U.S. Health Law /

Group Author: Cohen, I. Glenn (Editor); Hoffman, Allison K. (Editor); Sage, William M. (Editor)
Published: Oxford University Press,
Publication Dates: [2017]
Call Number: D971.221.6-62/O984-1

Book

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