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Advances in metrology for X-ray and EUV optics VIII : 11-12 August 2019, San Diego, California, United States /

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Corporate Authors: SPIE Society
Group Author: Assoufid, Lahsen; Ohashi, Haruhiko; Asundi, Anand
Published: SPIE,
Publication Dates: [2019]
Call Number: TB96-532/A244-1/2019
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Advances in metrology for X-ray and EUV optics VII : 6-7 August 2017, San Diego, California, United States /

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Corporate Authors: SPIE Society
Group Author: Assoufid, Lahsen; Ohashi, Haruhiko; Asundi, Anand
Published: SPIE,
Publication Dates: [2017]
Call Number: TB96-532/A244-1/2017
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8
Advances in metrology for X-ray and EUV optics V : 18 August 2014, San Diego, California, United States /

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Corporate Authors: SPIE Society
Group Author: Assoufid, Lahsen; Ohashi, Haruhiko; Asundi, Anand
Published: SPIE,
Publication Dates: [2014]
Call Number: TB96-532/A244-1/2014
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9
Electro-optical system analysis and design : a radiometry perspective /

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Main Authors: Willers, Cornelius J
Published: SPIE Press,
Publication Dates: [2013]
Call Number: TN201/W712
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11
Advances in metrology for X-ray and EUV optics IV 12 August 2012, San Diego, California, United States

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Corporate Authors: SPIE Society
Group Author: Takacs Peter Z; Asundi Anand; Assoufid Lahsen
Published: SPIE,
Publication Dates: 2012.
Call Number: TB96-532/A244-1/2012
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12
Advances in metrology for x-ray and EUV optics III 1-2 August 2010, San Diego, California, United States

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Corporate Authors: SPIE Society
Group Author: Takacs Peter Z; Asundi Anand; Assoufid Lahsen
Published: SPIE,
Publication Dates: c2010.
Call Number: TB96-532/A244-1/2010
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14
Modeling aspects in optical metrology 18-19 June 2007, Munich, Germany

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Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Bodermann Bernd; Silver Richard M; Bosse Harald
Published: SPIE,
Publication Dates: c2007.
Call Number: O432.2-532/M689/2007
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20
X-ray optics design, performance, and applications 20-21 July 1999, Denver, Colorado

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Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Khounsary Ali M.
Published: SPIE,
Publication Dates: c1999.
Call Number: O434.1-532/X1/1999/
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