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Filter Related Topics: Laser interferometers AND Measurement AND Optical measurements

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Filter Related Topics: Laser interferometers AND Measurement AND Optical measurements

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Advances in metrology for X-ray and EUV optics IX : 24 August - 4 September 2020, Online Only, United States /

Corporate Authors: Advances in Metrology for X-Ray and EUV Optics Conference‏ Online Only, United States; SPIE Society
Group Author: Assoufid, Lahsen; Ohashi, Haruhiko; Asundi, Anand
Published: SPIE,
Publication Dates: [2020]
Call Number: TB96-532/A244-1/2020

Book

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Advances in metrology for X-ray and EUV optics VIII : 11-12 August 2019, San Diego, California, United States /

Corporate Authors: SPIE Society
Group Author: Assoufid, Lahsen; Ohashi, Haruhiko; Asundi, Anand
Published: SPIE,
Publication Dates: [2019]
Call Number: TB96-532/A244-1/2019

Book

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Advances in metrology for X-ray and EUV optics VII : 6-7 August 2017, San Diego, California, United States /

Corporate Authors: SPIE Society
Group Author: Assoufid, Lahsen; Ohashi, Haruhiko; Asundi, Anand
Published: SPIE,
Publication Dates: [2017]
Call Number: TB96-532/A244-1/2017

Book

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11th IMEKO TC14 Symposium on Laser Metrology for Precision Measurement and Inspection in Industry (LMPMI 2014) : Tsukuba, Japan 3-5 September 2014.

Corporate Authors: Symposium on Laser Metrology for Precision Measurement and Inspection in Industry Tsukuba, Japan
Published: Curran Associates, Inc.,
Publication Dates: 2015.
Call Number: TN247-532/S989/2014

Book

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Advances in metrology for X-ray and EUV optics V : 18 August 2014, San Diego, California, United States /

Corporate Authors: SPIE Society
Group Author: Assoufid, Lahsen; Ohashi, Haruhiko; Asundi, Anand
Published: SPIE,
Publication Dates: [2014]
Call Number: TB96-532/A244-1/2014

Book

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Advances in metrology for X-ray and EUV optics IV：12 August 2012, San Diego, California, United States

Corporate Authors: SPIE Society
Group Author: Takacs Peter Z; Asundi Anand; Assoufid Lahsen
Published: SPIE,
Publication Dates: 2012.
Call Number: TB96-532/A244-1/2012

Book

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Advances in metrology for x-ray and EUV optics III：1-2 August 2010, San Diego, California, United States

Corporate Authors: SPIE Society
Group Author: Takacs Peter Z; Asundi Anand; Assoufid Lahsen
Published: SPIE,
Publication Dates: c2010.
Call Number: TB96-532/A244-1/2010

Book

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Sixth International Symposium on Precision Mechanical Measurements : 8-12 August 2013, Guiyang, China /

Corporate Authors: International Symposium on Precision Mechanical Measurements Guiyang, China; International Committee on Measurements and Instrumentation; SPIE Society
Group Author: Fei, Yetai; Ye, Shenghua
Published:
Call Number: O432.2-532/I617/2013

Book

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Ninth International Symposium on Laser Metrology：30 June-2 July 2008, Singapore

Corporate Authors: International Symposium on Laser Metrology (9th 2008 Singapore; National University of Singapore. Dept. of Mechanical Engineering; Singapore. Agency for Science, Technology and Research; Singapore Institue of Manufacturing Technology; SPIE Society; Nanyang Technological University. School of Mechanical and Aerospace Engineering
Group Author: Asundi Anand; Quan Chenggen
Published: SPIE,
Publication Dates: c2008.
Call Number: TN247-532/I617/2008

Book

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Advances in metrology for X-ray and EUV optics II：30 August 2007, San Diego, California, USA

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Takacs Peter Z; Ohtsuka Masaru; Assoufid Lahsen
Published: SPIE,
Publication Dates: c2007.
Call Number: TB96-532/A244-1/2007

Book

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Advances in metrology for X-ray and EUV optics X : 22 August 2023, San Diego, California, United States /

Corporate Authors: Advances in Metrology for X-Ray and EUV Optics (Conference)‏ San Diego, California, United States); SPIE (Society)
Group Author: Assoufid, Lahsen (Editor); Ohashi, Haruhiko (Editor); Siewert, Frank (Editor)
Published: SPIE,
Publication Dates: [2023]
Call Number: TB96-532/A244-1/2023

Book

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Sixth International Symposium on Precision Engineering Measurements and Instrumentation：8-11 August 2010, Hangzhou, China

Corporate Authors: International Symposium on Precision Engineering Measurements and Instrumentation (6th 2010 Hangzhou, China); International Committee on Measurements and Instrumentation.; SPIE (Society); Ha'erbin gong ye da xue.; Zhongguo ji liang ce shi xue hui. Instrumentation Committee.; Zhongguo ji liang da xue.; Hefei gong ye da xue.
Group Author: (Jiubin); Wen Xianfang.; Tan J.
Published: SPIE,
Publication Dates: c2010.
Call Number: O432.2-532/I617/2010

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