1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems：proceedings : November 6-8, 1996, Boston, Massachusetts

Corporate Authors: IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (1996 Boston, Mass; IEEE Computer Society; IEEE Computer Society. Fault-Tolerant Computing Technical Committee
Published: IEEE Computer Society Press,
Publication Dates: c1996.
Call Number: TN302.8-532/I59/1996/