2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems：proceedings : 24-26 October, 2001, San Francisco, California

Corporate Authors: IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (2001 San Francisco, Calif; IEEE Computer Society. Fault-Tolerant Computing Technical Committee; IEEE Computer Society. Test Technology Technical Committee
Published: IEEE Computer Society Press,
Publication Dates: c2001.
Call Number: TP302.8-532/I59/2001