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Sorgenfrei,Theodor
《21世纪经济报道》著
Institute of Electrical and Electronics Engineers
21世纪中国美术家编委会[编]
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Materials reliability in microelectronics V symposium held April 17-21, 1995, San Francisco, California, U.S.A.

Cover is for reference only
Group Author: Oates Anthony S.
Published: Materials Research Society,
Publication Dates: c1995.
Call Number: TN40-532/M425/1995
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