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1

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2001 GaAs Reliability Workshop：proceedings : October 21, 2001, Baltimore, Maryland

Corporate Authors: GaAs Reliability Workshop (2001 Baltimore, Md; IEEE Electron Devices Society; JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards
Published: JEDEC IEEE,
Publication Dates: [c2001]
Call Number: TN304.2-532/G111/2001

Book

2

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Microelectronics manufacturability, yield, and reliability：20-21 October 1994, Austin, Texas

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Kawasaki Hisao; Vasquez Barbara
Published: SPIE,
Publication Dates: c1994.
Call Number: TN40-532/M626/1994/

Book

3

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The Reliability of service equipment : 21st-23rd February 1968 /

Corporate Authors: Great Britain. Ministry of Defence; National Council for Quality and Reliability; Institution of Mechanical Engineers Great Britain
Published:
Call Number: TJ-532/R382/1968

Book

4

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International Conference on Reliability of Power Supply Systems, 21-23 February 1977

Corporate Authors: International Conference on Reliability of Power Supply Systems (1st 1977 London, England; Institution of Electrical Engineers. Control and Automation Division; Institute of Electrical and Electronics Engineers. United Kingdom and Republic of Ireland Section; Institution of Electrical Engineers. Power Division
Published: Institution of Electrical Engineers,
Publication Dates: c1977.
Call Number: TM7-53/I61/1977/

Book

5

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Test and measurement applications of optoelectronic devices：21-22 January, 2002, San Jose, USA

Group Author: Chin Aland K
Published: SPIE,
Publication Dates: c2002.
Call Number: TN203-532/T342/2002

Book

6

Cover is for reference only

Reliability physics 1983：21st annual proceedings, Phoenix, Arizona, April 5, 6, 7, 1983

Corporate Authors: International Reliability Physics Symposium (21st 1983 Phoenix, Ariz; IEEE Electron Devices Society; IEEE Reliability Society
Published: Electron Devices and Reliability Societies of the Institute of Electrical and Electronics Engineer[s],
Publication Dates: c1983.
Call Number: TN306-53/I59.1/1983/

Book

7

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2016 IEEE International Reliability Physics Symposium : (IRPS 2016) : Pasadena, California, USA, 17-21 April 2016.

Corporate Authors: IEEE International Reliability Physics Symposium Pasadena, California, USA; Institute of Electrical and Electronic Engineers
Published: IEEE,
Publication Dates: [2016]
Call Number: TN306-532/R382/2016

Book

8

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Optical fiber and fiber component mechanical reliability and testing II：21 January 2002, San Jose, [California] USA

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Kurkjian Charles R; Matthewson M. John
Published: SPIE,
Publication Dates: c2002.
Call Number: TN25-532/O626/2002

Book

9

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Reliability, packaging, testing, and characterization of MEMS/MOEMS VII：21-22 January 2008, San Jose, California, USA

Corporate Authors: Society of Photo-Optical Instrumentation Engineers; Boston University. Photonics Center
Group Author: Hartzell Allyson L; Ramesham Rajeshuni
Published: SPIE,
Publication Dates: c2008.
Call Number: TN406-532/R382/2008

Book

10

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2005 IEEE International Reliability Physics Symposium proceedings：43rd annual : San Jose, California, April 17-21, 2005

Corporate Authors: International Reliability Physics Symposium (43rd 2005 San Jose, Calif; IEEE Reliability Society; IEEE Electron Devices Society
Published: Institute of Electrical and Electronics Engineers,
Publication Dates: c2005.
Call Number: TN306-532/R382/2005

Book

11

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Dependable computing：first Latin-American symposium, LADC 2003, São Paulo, Brazil, October 21-24, 2003 : proceedings

Corporate Authors: LADC 2003 (1st 2003 São Paulo, Brazil
Group Author: Lemos Rogério de 1961-; Weber Taisy Silva 1953-; Camargo João Batista 1958-
Published: Springer,
Publication Dates: c2003.
Call Number: TP33-532/D419/2003

Book

12

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2002 IEEE International Integrated Reliability Workshop：final report : Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002

Corporate Authors: IEEE International Integrated Reliability Workshop (2002 Lake Tahoe, Calif; IEEE Electron Devices Society; IEEE Reliability Society
Published: IEEE Society,
Publication Dates: c2002.
Call Number: TN406-532/I61/2002

Book

13

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1999 IEEE International Integrated Reliability Workshop final report：Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1999

Corporate Authors: International Integrated Reliability Workshop (1999 Lake Tahoe, Calif; IEEE Electron Devices Society; IEEE Reliability Society
Published: IEEE Electron Devices Society,
Publication Dates: c1999.
Call Number: TN406-532/I59/1999/

Book

14

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Materials reliability in microelectronics V：symposium held April 17-21, 1995, San Francisco, California, U.S.A.

Group Author: Oates Anthony S.
Published: Materials Research Society,
Publication Dates: c1995.
Call Number: TN40-532/M425/1995

Book

15

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Quality of service：IWQoS 2005 : 13th international workshop, IWQoS 2005, Passau, Germany, June 21-23, 2005 : proceedings

Corporate Authors: International Workshop on Quality of Service (13th 2005 Passau, Germany
Group Author: Meer Hermann de; Bhatti Nina
Published: Springer,
Publication Dates: c2005.
Call Number: TP393.07-532/I618/2005

Book

16

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Computer safety, reliability, and security：23rd international conference, SAFECOMP 2004, Potsdam, Germany, September 21-24, 2004 : proceedings

Corporate Authors: SAFECOMP 2004 (2004 Potsdam, Germany
Group Author: Heisel Maritta; Liggesmeyer Peter; Wittmann Stefan
Published: Springer,
Publication Dates: 2004.
Call Number: TP309-532/I61/2004

Book

17

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Computer safety, reliability, and security：21st International Conference, SAFECOMP 2002, Catania, Italy, September 10-13, 2002 : proceedings

Corporate Authors: SAFECOMP 2002 (2002 Catania, Italy
Group Author: Bologna Sandro; Felici Massimo 1973-; Anderson Stuart 1952-
Published: Springer,
Publication Dates: c2002.
Call Number: TP309-532/I61/2002

Musical Score Book

18

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Damage assessment, reliability, and life prediction of power plant components：presented at the ..., Nashville, Tennessee, June 17-21, 1990

Corporate Authors: Pressure Vessels and Piping Conference 1990 : Nashville, Tenn; American Society of Mechanical Engineers. Pressure Vessels and Piping Division
Published: ASME,
Publication Dates: c1990.
Call Number: TM62-53/P935/1990/

Book

19

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2010 IEEE International Integrated Reliability Workshop final report：(IRW 2010), S. Lake Tahoe, California, 17-21 October 2010.

Corporate Authors: International Integrated Reliability Workshop (2010 S. Lake Tahoe, California; Institute of Electrical and Electronic Engineers
Published: IEEE
Publication Dates: c 2010.
Call Number: TN406-532/I61/2010

Book

20

Cover is for reference only

Symposium on Reliability in Distributed Software and Database Systems : proceedings, July 21-22, 1981, Holiday Inn Central (Greentree), Pittsburgh, PA /

Corporate Authors: Symposium on Reliability in Distributed Software and Database Systems Pittsburgh, Pa; IEEE Computer Society; Association for Computing Machinery
Published: IEEE Computer Society Press,
Publication Dates: 1981.
Call Number: TP392-53/S989/1981

Book

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