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1

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Damage to VUV, EUV, and X-ray optics V : 15-16 April 2015, Prague, Czech Republic /

Corporate Authors: SPIE Society
Group Author: Juha, Libor; Bajt, Saša; London, Richard A
Published: SPIE,
Publication Dates: [2015]
Call Number: O434-532/D154/2015

Book

2

Cover is for reference only

Damage to VUV, EUV, and X-ray optics VI : 24-25 April 2017, Prague, Czech Republic /

Corporate Authors: SPIE Society; Science and Technology Facilities Council United Kingdom
Group Author: Juha, Libor; Bajt, Saša; Soufli, Regina
Published: SPIE,
Publication Dates: [2017]
Call Number: O434-532/D154/2017

Book

3

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Optics Damage and Materials Processing by EUV/X-ray Radiation VII : 1-3 April 2019, Prague, Czech Republic /

Corporate Authors: Optics Damage and Materials Processing by EUV/X-Ray Radiation Congresses Prague, Czech Republic; SPIE Society
Group Author: Juha, Libor; Bajt, Saša; Guizard, Stéphane
Published: SPIE,
Publication Dates: [2019]
Call Number: O434-532/O627/2019

Book

4

Cover is for reference only

Damage to VUV, EUV, and x-ray optics II：21-23 April 2009, Prague, Czech Republic

Corporate Authors: Akademie věd České republiky. Fyzikální ústav; SPIE Society; SPIE Europe
Group Author: Bajt Saša; Sobierajski Ryszard H; Juha Libor
Published: SPIE,
Publication Dates: 2009.
Call Number: O434-532/D154/2009

Book

5

Cover is for reference only

Damage to VUV, EUV, and X-ray optics IV ; and EUV and X-ray optics : synergy between laboratory and space III : 15-18 April 2013, Prague, Czech Republic /

Corporate Authors: SPIE Society; EUV and X-ray Optics : Synergy between Laboratory and Space Prague, Czech Republic; Damage to VUV, EUV, and X-ray optics Prague, Czech Republic
Group Author: Juha, Libor; Bajt, Saša; London, Richard A; Hudec, R; Pina, Ladislav
Published: SPIE,
Publication Dates: [2013]
Call Number: O434-532/D154/2013

Book

6

Cover is for reference only

Optics Damage and Materials Processing by EUV/X-ray Radiation (XDam8) : 24-26 April 2023, Prague, Czech Republic /

Corporate Authors: Optics Damage and Materials Processing by EUV/X-Ray Radiation (Congresses) Prague, Czech Republic); ELI Beamlines (Czech Republic) (co-organizing body.); HiLASE (Czech Republic) (co-organizing body.); Laserlab Europe (co-organizing body.); AWE (United Kingdom) (co-organizing body.); STFC (United Kingdom) (co-organizing body.); Society of Photographic Instrumentation Engineers. (sponsoring body.)
Group Author: Juha, Libor (Editor); Bajt, Saša (Editor); Guizard, Stéphane (Editor)
Published: SPIE,
Publication Dates: [2023]
Call Number: O434-532/O627/2023

Book

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