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1

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Proceedings of the IEEE SoutheastCon 2010：Charlotte, North Carolina, USA, 18-21 March 2010

Corporate Authors: IEEE SoutheastCon (2010 Charlotte, North Carolina, USA; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers. Atlanta Section; Institute of Electrical and Electronics Engineers. Region 3
Published: IEEE,
Publication Dates: c2010.
Call Number: TN1-532/I59-3/2010

Book

2

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International Test Conference 2003：proceedings : board and system test track : [September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA

Corporate Authors: International Test Conference (2003 Charlotte, N.C; IEEE Computer Society. Test Technology Technical Committee; Institute of Electrical and Electronics Engineers. Philadelphia Section
Published: International Test Conference IEEE,
Publication Dates: c2003.
Call Number: TP306-532/I61/2003

Book

3

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ITC International Test Conference 2004：proceedings : October 26-October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA

Corporate Authors: International Test Conference (35th 2004 Charlotte, N.C; IEEE Computer Society. Test Technology Technical Committee; Institute of Electrical and Electronics Engineers. Philadelphia Section
Published: International Test Conference IEEE,
Publication Dates: c2004.
Call Number: TP306-532/I61/2004

Book

4

Cover is for reference only

International Test Conference 2003：proceedings, [September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA

Corporate Authors: International Test Conference (34th 2003 Charlotte, N.C; IEEE Computer Society. Test Technology Technical Committee; Institute of Electrical and Electronics Engineers. Philadelphia Section
Published: International Test Conference IEEE,
Publication Dates: c2003.
Call Number: TP306-532/I61/2003

Book

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