馆藏书目查询系统 - 上海图书馆

1

Cover is for reference only

Machine vision inspection systems. Volume 2, Machine -learning-based approaches/

Corporate Authors: Wiley Online Library (Online service)
Group Author: Malarvel, Muthukumaran; Nayak, Soumya Ranjan, 1984-; Pattnaik, Prasant Kumar, 1969-; Panda, Sury Narayan
Published: Scrivener Publishing,
Publication Dates: 2021.

eBook

2

Cover is for reference only

Machine vision inspection systems. Volume 2, Machine -learning-based approaches/

Corporate Authors: Wiley Online Library (Online service)
Group Author: Malarvel, Muthukumaran; Nayak, Soumya Ranjan, 1984-; Pattnaik, Prasant Kumar, 1969-; Panda, Sury Narayan
Published: Scrivener Publishing,
Publication Dates: 2021.

eBook

3

Cover is for reference only

Machine vision inspection systems. Volume 2, Machine learning-based approaches /

Group Author: Malarvel, Muthukumaran; Nayak, Soumya Ranjan, 1984-; Panda, Sury Narayan; Pattnaik, Prasant Kumar, 1969-
Published: Wiley-Scrivener,
Publication Dates: 2021.
Call Number: TP391.41/M149-3/v.2

Book

4

Cover is for reference only

Machine vision inspection systems/

Corporate Authors: Wiley Online Library (Online service)
Group Author: Malarvel, Muthukumaran; Nayak, Soumya Ranjan, 1984-; Panda, Sury Narayan; Pattnaik, Prasant Kumar, 1969-; Muangnak, Nittaya
Published: Wiley-Scrivener,
Publication Dates: 2020.

eBook

5

Cover is for reference only

Machine vision inspection systems/

Corporate Authors: Wiley Online Library (Online service)
Group Author: Malarvel, Muthukumaran; Nayak, Soumya Ranjan, 1984-; Panda, Sury Narayan; Pattnaik, Prasant Kumar, 1969-; Muangnak, Nittaya
Published: Wiley-Scrivener,
Publication Dates: 2020.

eBook

6

Cover is for reference only

Machine vision inspection systems. Volume 1, Image processing, concepts, methodologies and applications /

Group Author: Malarvel, Muthukumaran; Nayak, Soumya Ranjan, 1984-; Panda, Sury Narayan; Pattnaik, Prasant Kumar, 1969-; Muangnak, Nittaya
Published: Wiley-Scrivener,
Publication Dates: 2020.
Call Number: TP391.41/M149/v.1

Book

7

Cover is for reference only

Machine vision : automated visual inspection : theory, practice and applications /

Main Authors: Beyerer, Jürgen
Group Author: Puente León, Fernando, 1969; Frese, Christian
Published: Springer,
Publication Dates: [2016]
Call Number: TN27/B573

Book

8

Cover is for reference only

Machine vision applications in industrial inspection XV：29-30 January, 2007, San Jose, California, USA

Corporate Authors: Society of Photo-Optical Instrumentation Engineers; IS & T--the Society for Imaging Science and Technology
Group Author: Niel Kurt S; Mériaudeau Fabrice
Published: SPIE,
Publication Dates: c2007.
Call Number: TB4-532/M149/2007

Book

9

Cover is for reference only

Machine vision applications in industrial inspection XIV：16-17 January, 2006, San Jose, California, USA

Corporate Authors: Society of Photo-Optical Instrumentation Engineers; IS & T--the Society for Imaging Science and Technology
Group Author: Niel Kurt S; Maeriaudeau Fabrice
Published: SPIE IS&T,
Publication Dates: c2006.
Call Number: TB4-532/M149/2006

Book

10

Cover is for reference only

Machine vision applications in industrial inspection XIII：17-18 January 2005, San Jose, California, USA

Corporate Authors: Society of Photo-Optical Instrumentation Engineers; IS & T--the Society for Imaging Science and Technology
Group Author: Maeriaudeau Fabrice; Price Jeffery Ray 1970-
Published: SPIE IS&T,
Publication Dates: c2005.
Call Number: TB4-532/M149/2005

Book

11

Cover is for reference only

Machine vision applications in industrial inspection XII：21-22 January, 2004, San Jose, California, USA

Corporate Authors: Society of Photo-Optical Instrumentation Engineers; IS & T--the Society for Imaging Science and Technology
Group Author: Mériaudeau Fabrice; Price Jeffery Ray 1970-
Published: SPIE,
Publication Dates: c2004.
Call Number: TB4-532/M149/2004

Book

12

Cover is for reference only

Machine vision applications in industrial inspection IX：22-23 January, 2001, San Jose, [California] USA

Corporate Authors: Society of Photo-Optical Instrumentation Engineers; IS & T--the Society for Imaging Science and Technology
Group Author: Hunt Martin A
Published: SPIE,
Publication Dates: c2001.
Call Number: TB4-532/M149/2001

Book

13

Cover is for reference only

Machine vision applications in industrial inspection VIII：24-26 January 2000, San Jose, California

Corporate Authors: Society of Photo-Optical Instrumentation Engineers; IS & T--the Society for Imaging Science and Technology
Group Author: Tobin Kenneth W
Published: SPIE,
Publication Dates: c2000.
Call Number: TB4-532/M149/2000

Book

14

Cover is for reference only

Machine vision applications in industrial inspection VII：25-26 January 1999, San Jose, California

Corporate Authors: Society of Photo-Optical Instrumentation Engineers; IS & T--the Society for Imaging Science and Technology
Group Author: Chang Ning-San; Tobin Kenneth W
Published: SPIE,
Publication Dates: c1999.
Call Number: TB4-532/M149/1999/

Book

15

Cover is for reference only

Machine vision systems for inspection and metrology VIII：21-22 September 1999, Boston, Massachusetts

Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Solomon Susan Snell; Batchelor Bruce G; Miller John W. V
Published: SPIE,
Publication Dates: c1999.
Call Number: TP391.4-532/M149/1999/

Book

16

Cover is for reference only

Machine vision applications in industrial inspection VI：27 January 1998, San Jose, California

Corporate Authors: Society of Photo-Optical Instrumentation Engineers; IS & T--the Society for Imaging Science and Technology
Group Author: Chang Ning-San; Ravishankar Rao A
Published: SPIE,
Publication Dates: c1998.
Call Number: TB4-532/M149/1998/

Book

17

Cover is for reference only

Automated optical inspection for industry：theory, technology, and applications II : 16-19 September, 1998, Beijing, China

Corporate Authors: Chung-kuo kuang hs鑥eh hs鑥eh hui; Kuo chia tzu jan k皁 hs鑥eh chi chin wei y鑥an hui China; Society of Photo-Optical Instrumentation Engineers
Group Author: Yeh Sheng-hua 1934-
Published: SPIE,
Publication Dates: c1998.
Call Number: TP277-532/A939/1998/

Book

18

Cover is for reference only

Machine vision systems for inspection and metrology VII：4-5 November, 1998, Boston, Massachusetts

Corporate Authors: Machine Vision Association of SME; Society of Photo-Optical Instrumentation Engineers
Group Author: Miller John W. V; Solomon Susan Snell; Batchelor Bruce G
Published: SPIE,
Publication Dates: c1998.
Call Number: TP391.4-532/M149/1998/

Book

19

Cover is for reference only

Machine vision applications in industrial inspection V：10-11 February 1997, San Jose, California

Corporate Authors: Society of Photo-Optical Instrumentation Engineers; IS & T--the Society for Imaging Science and Technology
Group Author: Chang Ning-San; Rao A. Ravishankar
Published: SPIE,
Publication Dates: c1997.
Call Number: TB4-532/M149/1997/

Book

20

Cover is for reference only

Machine vision applications in industrial inspection IV：31 January-1 February, 1996, San Jose, California

Corporate Authors: Society of Photo-Optical Instrumentation Engineers; IS & T--the Society for Imaging Science and Technology
Group Author: Chang Ning-San; Ravishankar Rao A
Published: SPIE,
Publication Dates: c1996.
Call Number: TB4-532/M149/1996/

Book

Narrow Search